F. Charlet, C. Bermond, S. Putot, G. Le Carval, B. Fléchet
{"title":"Extraction of (R,L,C,G) interconnect parameters in 2D transmission lines using fast and efficient numerical tools","authors":"F. Charlet, C. Bermond, S. Putot, G. Le Carval, B. Fléchet","doi":"10.1109/SISPAD.2000.871214","DOIUrl":null,"url":null,"abstract":"We present a new simulation method for a fast and efficient extraction of frequency dependent R,L,C,G parameters in 2D transmission line structures embedded in a multilayered dielectric environment. Our method is based on two variational finite element formulations and use very efficient numerical tools (fictitious domain approach (Putot et al., 1999), fast solver, domain decomposition). It needs only an unstructured mesh of the conductor boundaries and is very memory and CPU time efficient. The results are validated on test structures with an original method of measurements and characterization.","PeriodicalId":132609,"journal":{"name":"2000 International Conference on Simulation Semiconductor Processes and Devices (Cat. No.00TH8502)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-09-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"19","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 International Conference on Simulation Semiconductor Processes and Devices (Cat. No.00TH8502)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SISPAD.2000.871214","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 19
Abstract
We present a new simulation method for a fast and efficient extraction of frequency dependent R,L,C,G parameters in 2D transmission line structures embedded in a multilayered dielectric environment. Our method is based on two variational finite element formulations and use very efficient numerical tools (fictitious domain approach (Putot et al., 1999), fast solver, domain decomposition). It needs only an unstructured mesh of the conductor boundaries and is very memory and CPU time efficient. The results are validated on test structures with an original method of measurements and characterization.
我们提出了一种新的仿真方法,用于快速有效地提取嵌入在多层介质环境中的二维传输线结构中与频率相关的R,L,C,G参数。我们的方法基于两个变分有限元公式,并使用非常有效的数值工具(虚拟域方法(Putot et al., 1999),快速求解器,域分解)。它只需要导体边界的非结构化网格,并且非常节省内存和CPU时间。用一种原始的测量和表征方法在测试结构上验证了结果。