Hierarchical functional timing analysis

Y. Kukimoto, R. Brayton
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引用次数: 21

Abstract

We propose a hierarchical timing analysis technique for combinational circuits under the tightest known sensitization criterion, the XBDO delay model. Given a hierarchical combinational circuit, a generalized delay model of each leaf module is characterized first. Since this timing characterization step takes into account false paths in each module, the delay model is more accurate than the one obtained by topological analysis. Then topological delay analysis is performed on the circuit composed of generalized gates replacing the leaf modules, where the "gate" delay model is the derived one. As far as the authors know, this is the first result that shows that hierarchical analysis is possible under state-of-the-art tight sensitization criteria. We demonstrate by experimental results that loss of accuracy in using the hierarchical approach is very minimal in practice. The theory developed in this paper also provides a foundation for incremental timing analysis under accurate sensitization criteria.
分层功能时序分析
我们提出了一种基于已知最严格敏化标准的组合电路分层时序分析技术,即XBDO延迟模型。给定一个分层组合电路,首先对每个叶模块的广义延迟模型进行了刻画。由于该时序表征步骤考虑了每个模块中的假路径,因此延迟模型比拓扑分析得到的模型更精确。然后对由广义门代替叶模块组成的电路进行拓扑延迟分析,其中“门”延迟模型为推导出的延迟模型。据作者所知,这是第一个结果,表明在最先进的严格敏化标准下,分层分析是可能的。我们通过实验结果证明,在实践中,使用分层方法的精度损失是非常小的。本文所建立的理论也为精确敏化准则下的增量时序分析提供了基础。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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