In-situ antimony doping of CdTe

M. Khan, V. Evani, V. Palekis, P. Bane, S. Collins, D. Morel, C. Ferekides
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引用次数: 6

Abstract

The effect of in-situ Antimony (Sb) doping on polycrystalline Cadmium Telluride (CdTe) deposited by Elemental Vapor Transport (EVT) is investigated. The presence of Sb in the film is verified by SIMS measurements. The film structures were studied by Scanning Electron Microscopy (SEM) and X-Ray Diffraction (XRD) measurements. The Sb doped CdTe films were fabricated into solar cells and characterized by standard Current-Voltage (JV) and Spectral Response (SR) measurements. The performance of the cells did not reach the state-of-the-art level, however, VOC's up to 760 mV were observed without any post deposition Cu or CdCl2 heat treatment. Capacitance-Voltage (CV) measurements indicated a change in the p-type doping concentration (as high as 1016 cm-3) as a function of gas phase Cd/Te ratio and Sb concentration. 1-Photon TRPL measurements showed minority carrier lifetime, τ > 1ns for the films with the highest doping.
CdTe的原位锑掺杂
研究了原位锑(Sb)掺杂对元素气相输运(EVT)沉积多晶碲化镉(CdTe)的影响。通过SIMS测量证实了Sb在薄膜中的存在。采用扫描电子显微镜(SEM)和x射线衍射仪(XRD)对膜的结构进行了研究。将Sb掺杂CdTe薄膜制备到太阳能电池中,并通过标准电流电压(JV)和光谱响应(SR)测量对其进行了表征。虽然电池的性能没有达到最先进的水平,但在未进行Cu或CdCl2热处理的情况下,电池的VOC高达760 mV。电容电压(CV)测量表明,p型掺杂浓度(高达1016 cm-3)随气相Cd/Te比和Sb浓度的变化而变化。1光子TRPL测量表明,掺杂最高的薄膜载流子寿命较短,τ > 1ns。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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