Cross-Lock: Dense Layout-Level Interconnect Locking using Cross-bar Architectures

Kaveh Shamsi, Meng Li, D. Pan, Yier Jin
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引用次数: 39

Abstract

Logic locking is an attractive defense against a series of hardware security threats. However, oracle guided attacks based on advanced Boolean reasoning engines such as SAT, ATPG and model-checking have made it difficult to securely lock chips with low overhead. While the majority of existing locking schemes focus on gate-level locking, in this paper we present a layout-inclusive interconnect locking scheme based on cross-bars of metal-to-metal programmable-via devices. We demonstrate how this enables configuring a large obfuscation key with a small number of physical key wires contributing to zero to little substrate area overhead. Dense interconnect locking based on these circuit level primitives shows orders of magnitude better SAT attack resiliency compared to an XOR/XNOR gate-insertion locking with the same key length which has a much higher overhead.
交叉锁:密集布局级互连锁使用交叉条架构
逻辑锁定是抵御一系列硬件安全威胁的有效手段。然而,基于高级布尔推理引擎(如SAT、ATPG和模型检查)的oracle引导攻击使得安全锁定低开销芯片变得困难。虽然大多数现有的锁定方案都集中在门级锁定上,但在本文中,我们提出了一种基于金属对金属可编程通孔器件交叉条的包含布局的互连锁定方案。我们将演示如何使用少量的物理键线来配置大型混淆键,从而减少基板面积开销。基于这些电路级原语的密集互连锁定与具有更高开销的相同键长度的异或/异或门插入锁定相比,显示出数量级更好的SAT攻击弹性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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