{"title":"Approaches for a destructive measurement method of subsurface damages (Conference Presentation)","authors":"M. Seiler","doi":"10.1117/12.2537877","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":334783,"journal":{"name":"Optical Measurement Systems for Industrial Inspection XI","volume":"121 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-08-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Measurement Systems for Industrial Inspection XI","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2537877","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}