Achieving Reduced Production Cycle Times Via Effective Control of Key Factors of the P-K Equation

A. Kalir, S. Bouhnik
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引用次数: 4

Abstract

In the current environment of flash semiconductor market, competitive cycle times are the key to success. Cycle time (CT) reduction can be achieved by process time elimination and equipment performance improvement, but also by optimized WIP management policy. In this paper, we discuss how significant CT reductions are attained via the effective change of parameter values of the governing WIP management policy of a semiconductor factory. A full factorial design of experiments (DOE) was performed, and several parameters were examined. The impact on the coefficient of variability of departure rate (CDR) and CT was evaluated. Results have clearly shown that by changing the values of these parameters, significant cycle time reductions of up to 13% can be achieved
通过对P-K方程关键因素的有效控制,实现缩短生产周期
在当前闪存半导体市场环境下,竞争激烈的周期时间是成功的关键。周期时间(CT)的减少可以通过工艺时间的消除和设备性能的改进来实现,也可以通过优化在制品管理政策来实现。在本文中,我们讨论了如何通过有效改变半导体工厂的在制品管理策略的参数值来实现显著的CT降低。进行了全因子实验设计(DOE),并对几个参数进行了检查。评估了对离职率变异性系数(CDR)和CT的影响。结果清楚地表明,通过改变这些参数的值,可以实现显著的周期时间减少高达13%
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