T. Braun, M. Topper, K. Becker, M. Wilke, M. Huhn, U. Maass, I. Ndip, R. Aschenbrenner, K. Lang
{"title":"Opportunities of Fan-out Wafer Level Packaging (FOWLP) for RF applications","authors":"T. Braun, M. Topper, K. Becker, M. Wilke, M. Huhn, U. Maass, I. Ndip, R. Aschenbrenner, K. Lang","doi":"10.1109/SIRF.2016.7445461","DOIUrl":null,"url":null,"abstract":"Fan-out Wafer Level Packaging (FOWLP) is one of the latest packaging trends in microelectronics. For FOWLP known good bare dies are embedded into mold compound forming a reconfigured wafer. A thin film redistribution layer is applied on the reconfigured wafer routes the die pads to the space around the die on the mold compound (fan-out). After solder ball placement and package singulation by dicing a SMD compatible package is completed. FOWLP has a high potential in significant package miniaturization concerning package volume but also in thickness. Main advantages of FOWLP are the substrate-less package, lower thermal resistance, higher performance due to shorter interconnects together with direct IC connection by thin film metallization instead of wire bonds or flip chip bumps and lower parasitic effects. Especially the inductance of the FOWLP is much lower compared to FC-BGA packages. In addition the redistribution layer can also provide embedded passives (R, L, C) as well as antenna structures using a multi-layer structure. It can be used for multi-chip packages for System in Package (SiP) and heterogeneous integration. Hence, technology is well suited for RF applications.","PeriodicalId":138697,"journal":{"name":"2016 IEEE 16th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF)","volume":"267 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 16th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SIRF.2016.7445461","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10
Abstract
Fan-out Wafer Level Packaging (FOWLP) is one of the latest packaging trends in microelectronics. For FOWLP known good bare dies are embedded into mold compound forming a reconfigured wafer. A thin film redistribution layer is applied on the reconfigured wafer routes the die pads to the space around the die on the mold compound (fan-out). After solder ball placement and package singulation by dicing a SMD compatible package is completed. FOWLP has a high potential in significant package miniaturization concerning package volume but also in thickness. Main advantages of FOWLP are the substrate-less package, lower thermal resistance, higher performance due to shorter interconnects together with direct IC connection by thin film metallization instead of wire bonds or flip chip bumps and lower parasitic effects. Especially the inductance of the FOWLP is much lower compared to FC-BGA packages. In addition the redistribution layer can also provide embedded passives (R, L, C) as well as antenna structures using a multi-layer structure. It can be used for multi-chip packages for System in Package (SiP) and heterogeneous integration. Hence, technology is well suited for RF applications.
扇出晶圆级封装(FOWLP)是微电子领域最新的封装趋势之一。对于FOWLP,已知的良好裸模被嵌入到模具化合物中,形成重新配置的晶圆。在重新配置的晶圆上应用薄膜再分配层,将模具垫路由到模具化合物上模具周围的空间(扇形)。在焊球放置和封装切割后,SMD兼容封装就完成了。FOWLP在封装体积小型化和封装厚度小型化方面具有很高的潜力。FOWLP的主要优点是无衬底封装,低热阻,由于更短的互连以及通过薄膜金属化直接集成电路连接而不是线键或倒装芯片碰撞而获得更高的性能,以及更低的寄生效应。特别是FOWLP的电感比FC-BGA封装低得多。此外,再分配层还可以提供嵌入式无源(R、L、C)以及采用多层结构的天线结构。它可以用于SiP (System in Package)的多芯片封装和异构集成。因此,该技术非常适合射频应用。