K. Yeo, K. Cho, Ming Li, S. Suk, Y. Yeoh, Min-Sang Kim, H. Bae, Ji-myoung Lee, Suk-kang Sung, Jun Seo, Bokkyoung Park, Dong-Won Kim, Donggun Park, Won-Seoung Lee
{"title":"Gate-all-around single silicon nanowire MOSFET with 7 nm width for SONOS NAND flash memory","authors":"K. Yeo, K. Cho, Ming Li, S. Suk, Y. Yeoh, Min-Sang Kim, H. Bae, Ji-myoung Lee, Suk-kang Sung, Jun Seo, Bokkyoung Park, Dong-Won Kim, Donggun Park, Won-Seoung Lee","doi":"10.1109/VLSIT.2008.4588593","DOIUrl":null,"url":null,"abstract":"Gate-all-around (GAA) MOSFET with single silicon nanowire is fabricated and applied to SONOS memory as a cell transistor for NAND flash string. Driving current over 1 uA, which is sufficient to NAND string, is obtained with single nanowire of ~7 nm width. Using FN tunneling conditions, VTH window of 4.5 V and fast program/erase (P/E) speed of ~10 us are obtained, respectively. The smaller nanowire width is, the faster program speed and the larger VTH shift are achieved. P/E operations in NAND string with GAA SONOS nanowire are demonstrated for the first time.","PeriodicalId":173781,"journal":{"name":"2008 Symposium on VLSI Technology","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 Symposium on VLSI Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIT.2008.4588593","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 21
Abstract
Gate-all-around (GAA) MOSFET with single silicon nanowire is fabricated and applied to SONOS memory as a cell transistor for NAND flash string. Driving current over 1 uA, which is sufficient to NAND string, is obtained with single nanowire of ~7 nm width. Using FN tunneling conditions, VTH window of 4.5 V and fast program/erase (P/E) speed of ~10 us are obtained, respectively. The smaller nanowire width is, the faster program speed and the larger VTH shift are achieved. P/E operations in NAND string with GAA SONOS nanowire are demonstrated for the first time.