Gate-all-around single silicon nanowire MOSFET with 7 nm width for SONOS NAND flash memory

K. Yeo, K. Cho, Ming Li, S. Suk, Y. Yeoh, Min-Sang Kim, H. Bae, Ji-myoung Lee, Suk-kang Sung, Jun Seo, Bokkyoung Park, Dong-Won Kim, Donggun Park, Won-Seoung Lee
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引用次数: 21

Abstract

Gate-all-around (GAA) MOSFET with single silicon nanowire is fabricated and applied to SONOS memory as a cell transistor for NAND flash string. Driving current over 1 uA, which is sufficient to NAND string, is obtained with single nanowire of ~7 nm width. Using FN tunneling conditions, VTH window of 4.5 V and fast program/erase (P/E) speed of ~10 us are obtained, respectively. The smaller nanowire width is, the faster program speed and the larger VTH shift are achieved. P/E operations in NAND string with GAA SONOS nanowire are demonstrated for the first time.
门全能单硅纳米线MOSFET,宽度为7nm,用于SONOS NAND闪存
制备了具有单硅纳米线的栅极全能(GAA) MOSFET,并将其作为NAND闪存串的单元晶体管应用于SONOS存储器。采用~ 7nm宽的单纳米线,可获得1ua以上的驱动电流,足以驱动NAND串。在FN隧穿条件下,分别获得了4.5 V的VTH窗口和~10 us的快速程序/擦除(P/E)速度。纳米线宽度越小,编程速度越快,VTH位移越大。首次演示了GAA SONOS纳米线在NAND串中的P/E操作。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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