Flip-chip encapsulation on ceramic substrates

J. Clementi, J. McCreary, T. Niu, J. Palomaki, J. Varcoe, G. Hill
{"title":"Flip-chip encapsulation on ceramic substrates","authors":"J. Clementi, J. McCreary, T. Niu, J. Palomaki, J. Varcoe, G. Hill","doi":"10.1109/ECTC.1993.346835","DOIUrl":null,"url":null,"abstract":"Flip-chip encapsulation has been shown to provide at least a 5-10/spl times/ improvement in fatigue life of C4 (controlled collapse chip connection) solder joints. IBM has developed, qualified and implemented encapsulation in production for a wide array of selected C4 footprint chips attached to ceramic substrates. In addition to providing a very substantial improvement in reliability, this technology has enabled major extensions to the flip-chip on ceramic menu by relaxing chip footprint or size constraints, accommodating larger chips and allowing smaller C4's on finer pitches. Also, new package technologies have evolved that feature thin and lightweight surface mountable designs that conform to industry outlines. IBM evaluated several encapsulant formulations and tested over 2000 encapsulated chips and 200000 individual C4's during the development and qualification phases. Test data was collected for a variety of accelerated thermal cycling (ATC) conditions and was supported by extensive finite element modeling. Chip configurations included memory and logic footprints and ranged in size to 14.7 mm chip size and 10.2 mm DNP (distance from neutral point of chip footprint). In all cases, ATC data showed a dramatic improvement in C4 life on encapsulated chips with no adverse effects in other tests. Several different encapsulant formulations, each with minor variations, were evaluated, and the encapsulant dispense and cure process was optimized for ease of manufacturing high production volumes that are required by IBM.<<ETX>>","PeriodicalId":281423,"journal":{"name":"Proceedings of IEEE 43rd Electronic Components and Technology Conference (ECTC '93)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"54","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE 43rd Electronic Components and Technology Conference (ECTC '93)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1993.346835","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 54

Abstract

Flip-chip encapsulation has been shown to provide at least a 5-10/spl times/ improvement in fatigue life of C4 (controlled collapse chip connection) solder joints. IBM has developed, qualified and implemented encapsulation in production for a wide array of selected C4 footprint chips attached to ceramic substrates. In addition to providing a very substantial improvement in reliability, this technology has enabled major extensions to the flip-chip on ceramic menu by relaxing chip footprint or size constraints, accommodating larger chips and allowing smaller C4's on finer pitches. Also, new package technologies have evolved that feature thin and lightweight surface mountable designs that conform to industry outlines. IBM evaluated several encapsulant formulations and tested over 2000 encapsulated chips and 200000 individual C4's during the development and qualification phases. Test data was collected for a variety of accelerated thermal cycling (ATC) conditions and was supported by extensive finite element modeling. Chip configurations included memory and logic footprints and ranged in size to 14.7 mm chip size and 10.2 mm DNP (distance from neutral point of chip footprint). In all cases, ATC data showed a dramatic improvement in C4 life on encapsulated chips with no adverse effects in other tests. Several different encapsulant formulations, each with minor variations, were evaluated, and the encapsulant dispense and cure process was optimized for ease of manufacturing high production volumes that are required by IBM.<>
陶瓷基板上的倒装芯片封装
倒装芯片封装已被证明至少提供5-10倍/spl /提高疲劳寿命的C4(控制崩溃芯片连接)焊点。IBM已经在生产中开发、认证并实施了封装,用于连接到陶瓷基板上的各种选定的C4足迹芯片。除了在可靠性方面提供了非常大的改进之外,该技术还通过放松芯片占用空间或尺寸限制,适应更大的芯片,并允许在更细的球场上使用更小的C4,从而大大扩展了陶瓷上的倒装芯片。此外,新的封装技术也在不断发展,其特点是薄而轻的表面贴装设计符合行业要求。IBM评估了几种封装剂配方,并在开发和鉴定阶段测试了2000多个封装芯片和20万个单独的C4。测试数据是在各种加速热循环(ATC)条件下收集的,并得到了广泛的有限元建模的支持。芯片配置包括内存和逻辑足迹,尺寸范围为14.7毫米芯片尺寸和10.2毫米DNP(距离芯片足迹中点的距离)。在所有情况下,ATC数据都显示封装芯片上C4寿命的显着改善,而在其他测试中没有任何不良影响。对几种不同的封装剂配方进行了评估,每种配方都有微小的变化,并对封装剂的分配和固化过程进行了优化,以方便IBM要求的高产量生产。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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