{"title":"Impact of Logic Synthesis on Soft Error Rate of Digital Integrated Circuits","authors":"D. Limbrick","doi":"10.1109/ISVLSI.2012.67","DOIUrl":null,"url":null,"abstract":"Reliability-aware synthesis exploits the properties of fault masking to improve the reliability of logic circuits. My dissertation investigates how synthesis constraints can impact the effectiveness of this technique.","PeriodicalId":398850,"journal":{"name":"2012 IEEE Computer Society Annual Symposium on VLSI","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE Computer Society Annual Symposium on VLSI","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISVLSI.2012.67","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Reliability-aware synthesis exploits the properties of fault masking to improve the reliability of logic circuits. My dissertation investigates how synthesis constraints can impact the effectiveness of this technique.