MEMS-based nano probe technology for data storage applications

Abstract

Data storage technology has evolved in two predominant directions in recent years, reflecting the two critical demands of large capacity and fast access. These two directions, embodied by hard disk drives (HDD) for the first direction, and random access memory (RAM) for the second one, have demonstrated phenomenal improvements in performance. The question arises as to whether one can envision an alternative technology that will combine the capacity of an HDD and access time of a RAM, within dimensions on the order of only several mm/sup 2/. A novel approach that is discussed involves the implementation of several concepts that have recently been advanced in the emerging field of nanotechnology. In particular, scanning probe microscopy using a large number of cantilevers operating in parallel offers a unique opportunity that is currently being pursued by several research groups at universities and companies around the world.