Integrated failure model for analog circuit simulation based on Saber platform

Abstract

A new failure model based on Saber platform is proposed to simulate familiar failure mode of analog circuit, such as open-circuit and short-circuit mode. With this new model, it becomes much easier and more convenient to carry out fault injection and failure simulation in analog circuit simulation. By using a representative case, it is validated that the integrated fault model is correct and the injection of this fault model is feasible.