{"title":"Velocity overshoot investigations in sub-micron GaAs devices by photoconduction experiments","authors":"S. Laval, C. Bru, C. Arnodo, R. Castagné","doi":"10.1109/IEDM.1980.189911","DOIUrl":null,"url":null,"abstract":"Direct evidence for electron velocity overshoot is obtained in Ga As sub-micron devices at room temperature. Photoconduction current variations as a function of electric field are compared for various device lengths and several incident light wavelengths.","PeriodicalId":180541,"journal":{"name":"1980 International Electron Devices Meeting","volume":"182 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1980 International Electron Devices Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.1980.189911","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Direct evidence for electron velocity overshoot is obtained in Ga As sub-micron devices at room temperature. Photoconduction current variations as a function of electric field are compared for various device lengths and several incident light wavelengths.