{"title":"Structural, electrical properties and degradation processes in the Cu- and Ni-enriched thick-film elements for sensor electronics","authors":"H. Klym","doi":"10.1109/ELNANO.2017.7939743","DOIUrl":null,"url":null,"abstract":"Structural and electrical properties as well as peculiarities of degradation processes in the Cu- and Ni-enriched thick-film elements based on oxymanganospinel ceramics are investigated. The thermal “shock” effect in the initial stage of isothermal exposure at 170 oC with future stabilization of electrical resistance on this level up to final degradation test was revealed. It is shown that high temperature-sensitivity and stabilization of electrical parameters in the studied single-phase thick-film elements can be used for preparation of sensor components based on thick films for micro- and nanoelectronics.","PeriodicalId":333746,"journal":{"name":"2017 IEEE 37th International Conference on Electronics and Nanotechnology (ELNANO)","volume":"49 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE 37th International Conference on Electronics and Nanotechnology (ELNANO)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ELNANO.2017.7939743","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Structural and electrical properties as well as peculiarities of degradation processes in the Cu- and Ni-enriched thick-film elements based on oxymanganospinel ceramics are investigated. The thermal “shock” effect in the initial stage of isothermal exposure at 170 oC with future stabilization of electrical resistance on this level up to final degradation test was revealed. It is shown that high temperature-sensitivity and stabilization of electrical parameters in the studied single-phase thick-film elements can be used for preparation of sensor components based on thick films for micro- and nanoelectronics.