The impact of ion implantation on VLSI

H. Ryssel
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引用次数: 2

Abstract

In this paper problems concerned with the application of ion implantation to VLSI technology are discussed. The problems discussed involve segregation, oxidation, diffusion, lateral spread, and as new applications of ion implantation gettering, local oxidation, buried layers, damage etching, and beam writing.
离子注入对VLSI的影响
本文讨论了离子注入在超大规模集成电路技术中的应用问题。讨论的问题包括偏析、氧化、扩散、横向扩散,以及离子注入的新应用:捕集、局部氧化、埋层、损伤蚀刻和光束写入。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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