V. Shanmugam, Tianwen Zhao, William Krams, A. Joshi, H. Cao, P. Schmidt
{"title":"Fatigue Reliability Analysis Framework for Medical Devices Based on a Probabilistic Finite Element Approach","authors":"V. Shanmugam, Tianwen Zhao, William Krams, A. Joshi, H. Cao, P. Schmidt","doi":"10.1520/STP161620180038","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":240447,"journal":{"name":"Fourth Symposium on Fatigue and Fracture of Metallic Medical Materials and Devices","volume":"54 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Fourth Symposium on Fatigue and Fracture of Metallic Medical Materials and Devices","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1520/STP161620180038","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}