Analysis of architectures of control equipment designed for testing ultra-high-speed integrated circuits

Abstract

The paper evaluates various approaches to construction of high-precision control equipment designed for testing high-speed integrated circuits of high level of integration, operating in wide frequency range. Automated test and diagnostics equipment significantly reduce the number of operations, which are being performed during testing and reveal most of the failures and flaws. Methods for improving the systems under development are proposed in this paper, these methods are based on structural optimization and allow improving performance, providing precision setting of the test signals levels and increasing rate of generating test sequences. The paper also analyses a method of control based on the phase synchronization systems.