Frieder Baumann, Brian Popielarski, Ryan Sweeney, Felix Beaudoin, K. Giewont
{"title":"Failure Analysis of Photonic Integrated Circuits","authors":"Frieder Baumann, Brian Popielarski, Ryan Sweeney, Felix Beaudoin, K. Giewont","doi":"10.31399/asm.edfa.2023-3.p023","DOIUrl":null,"url":null,"abstract":"\n This article introduces silicon photonics, describes what is needed for photonics failure analysis, and shows examples of analysis results for failures in modern silicon photonics circuits.","PeriodicalId":431761,"journal":{"name":"EDFA Technical Articles","volume":"69 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"EDFA Technical Articles","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.31399/asm.edfa.2023-3.p023","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This article introduces silicon photonics, describes what is needed for photonics failure analysis, and shows examples of analysis results for failures in modern silicon photonics circuits.