Switching and conducting performance of SiC-JFET and ESBT against MOSFET and IGBT

André Knop, W.-Toke Franke, Friedrich W. Fuchs
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引用次数: 19

Abstract

Here the switching and conducting performance of a SiC-JFET, an Emitter-Switching Bipolar Transistor (ESBT) and conventional power semiconductors as MOSFET and IGBT with Si- and SiC-diode is presented. The variety of power semiconductors is growing and there is a need to get rules to select them for the application given. The structure and special characteristics of the new devices are explained. The switching and conducting behavior of the devices is measured and investigated. The test circuit and the measurement method are presented. Based on the measured waveforms the power losses are calculated. The results of the switching and conducting performance of these power semiconductors are discussed.
SiC-JFET和ESBT对MOSFET和IGBT的开关和导通性能
本文介绍了SiC-JFET、发射开关双极晶体管(ESBT)和传统功率半导体器件如MOSFET和硅硅二极管IGBT的开关和导电性能。功率半导体的种类越来越多,有必要为给定的应用制定选择规则。介绍了新装置的结构和特点。测量和研究了器件的开关和导电行为。给出了测试电路和测试方法。根据实测波形计算了功率损耗。讨论了这些功率半导体的开关和导电性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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