Single Event Effects And Total Dose Testing Of Digital To Analog Converters

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI:10.1109/RADECS.2017.8696263

A. Karakozov, P.V. Nekraso, D. Bobrovsky, G. Sorokoumov, V. Telets

引用次数: 3

Abstract

In the article we introduce histogram method for digital to analog converters’ space radiation testing including both total dose and single event effects. We present new total dose and single event (SEL, SEU and SET) data of three DAC chips, as well as test setup and measurement system structure.

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数模转换器的单事件效应和总剂量测试

本文介绍了直方图法在数模转换器空间辐射测试中的应用，包括总剂量和单事件效应。本文介绍了三种DAC芯片的新总剂量和单事件(SEL、SEU和SET)数据，以及测试装置和测量系统结构。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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