OBIST strategy versus parametric test - Efficiency in covering catastrophic faults in active analog filters

D. Arbet, G. Gyepes, J. Brenkus, V. Stopjaková
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引用次数: 5

Abstract

This paper deals with the comparison of the fault coverage of catastrophic faults in active analog integrated filter obtained by the measurement of filter parameters and by the Oscillation-based Built-In Self Test (OBIST) approach. In our experiment, firstly, the cut-off frequency, ripple in the pass band, DC gain in pass band and group delay of the filters have been monitored in the operating mode. Then, during the test mode (OBIST), the filter is transformed to an oscillator, and the oscillation frequency is compared to the frequency from a dedicated on-chip reference oscillator to compensate undesired influence of technology variations. The obtained results on the efficiency of both approaches are compared.
OBIST策略与参数测试——有源模拟滤波器中覆盖灾难性故障的效率
本文比较了通过测量滤波器参数和基于振荡的内置自检(OBIST)方法得到的有源模拟集成滤波器灾难性故障的故障覆盖率。在我们的实验中,首先监测了滤波器在工作模式下的截止频率、通带纹波、通带直流增益和群延迟。然后,在测试模式(OBIST)期间,将滤波器转换为振荡器,并将振荡频率与专用片上参考振荡器的频率进行比较,以补偿技术变化的不良影响。对两种方法的效率进行了比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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