An Efficient 5-Transistor SRAM Cell Design using FNSBS-CNTFET for Improving Read and Write Stability

Gopavaram Suneel Kumar, Gannera Mamatha
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Abstract

In this manuscript, 5-Transistor SRAM Read/Write Assist Techniques based on Fully Nonvolatile Spin-Based Synapse Carbon Nanotube Field-Effect Transistor (FNSBS-CNTFET) is designed for improving read and write stability. It uses two cross-coupled FNSBS-CNTFET for storing data, along with one access transistor connected with bit line (BL) and word line (WL) with minimum supply voltage therefore leakage current is reduced. By this, the proposed method reduces the delay of writing and reading cycles and to get better static noise margin (SNM) and controls precharge voltage. The proposed 5 FNSBS-CNTFET-SRAM is done in the HSPICE platform. Then the performance of the proposed 5T FNSBS-CNTFET-SRAM design is measured in terms of lower Read Delay by 24.97%, 18.04%, lower Write Delay by 20.83%, 19.06% and compared with existing methods like 10T CNTFET-SRAM, 8T CNTFET SRAM respectively.
一种利用FNSBS-CNTFET提高读写稳定性的高效5晶体管SRAM单元设计
在本文中,基于完全非易失性自旋基突触碳纳米管场效应晶体管(FNSBS-CNTFET)的5晶体管SRAM读写辅助技术被设计用于提高读写稳定性。它使用两个交叉耦合FNSBS-CNTFET来存储数据,以及一个连接位线(BL)和字线(WL)的接入晶体管,具有最小的供电电压,因此减少了泄漏电流。通过这种方法,减少了写入和读取周期的延迟,获得了更好的静态噪声裕度(SNM),并控制了预充电电压。提出的5fnsbs - cntfet - sram是在HSPICE平台上完成的。与现有的10T CNTFET-SRAM、8T CNTFET-SRAM相比,5T FNSBS-CNTFET-SRAM的读延迟分别降低了24.97%、18.04%,写延迟分别降低了20.83%、19.06%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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