F. Ender, Kristóf Hegedűs, Richárd Csekő, A. Poppe
{"title":"Built-in Thermal Test as a Pre-Integrated Architecture","authors":"F. Ender, Kristóf Hegedűs, Richárd Csekő, A. Poppe","doi":"10.1109/ISSE54558.2022.9812759","DOIUrl":null,"url":null,"abstract":"Built-in Thermal Test is a key method to assure reliable operation during the product life time. Pre-integrated architecture is a design concept for cyber-physical systems to reduce R&D efforts. In this work the built-in thermal test methodology was adapted to this design concept and its operation was demonstrated in a chemical flow-reaction system where the reactor’s thermal interface was qualified. The demonstrational measurements showed that the system was able to distinguish different reactor assemblies with intentionally degraded thermal interfaces with a resolution of 0.05 K/W.","PeriodicalId":413385,"journal":{"name":"2022 45th International Spring Seminar on Electronics Technology (ISSE)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 45th International Spring Seminar on Electronics Technology (ISSE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSE54558.2022.9812759","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Built-in Thermal Test is a key method to assure reliable operation during the product life time. Pre-integrated architecture is a design concept for cyber-physical systems to reduce R&D efforts. In this work the built-in thermal test methodology was adapted to this design concept and its operation was demonstrated in a chemical flow-reaction system where the reactor’s thermal interface was qualified. The demonstrational measurements showed that the system was able to distinguish different reactor assemblies with intentionally degraded thermal interfaces with a resolution of 0.05 K/W.