J. Lau, Chris Chang, Ricky S. W. Lee, Tsung-yuan Chen, D. Cheng, T. Tseng, D. Lin
{"title":"DESIGN AND MANUFACTURING OF MICRO VIA-IN-PAD SUBSTRATES FOR SOLDER BUMPED FLIP CHIP APPLICATIONS","authors":"J. Lau, Chris Chang, Ricky S. W. Lee, Tsung-yuan Chen, D. Cheng, T. Tseng, D. Lin","doi":"10.1142/S0960313100000101","DOIUrl":null,"url":null,"abstract":"A novel and low-cost micro via-in-pad (VIP) substrate for supporting a solder bumped flip chip is presented in this study. Emphasis is placed on the design, materials, process, manufacturing, and reliability of the micro VIP substrate of a chip scale package (CSP), and of the micro VIP CSP printed circuit board (PCB) assembly. Cross-sections of samples are examined for a better understanding of the solder bump, CSP redistribution, VIP, and solder joint. Non-linear finite element analyses are used to determine the stress and strain in the copper VIP and the solder joint. Time-dependent non-linear analysis is used to predict the thermal-fatigue life of the VIP solder joint.","PeriodicalId":309904,"journal":{"name":"Journal of Electronics Manufacturing","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Electronics Manufacturing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1142/S0960313100000101","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
A novel and low-cost micro via-in-pad (VIP) substrate for supporting a solder bumped flip chip is presented in this study. Emphasis is placed on the design, materials, process, manufacturing, and reliability of the micro VIP substrate of a chip scale package (CSP), and of the micro VIP CSP printed circuit board (PCB) assembly. Cross-sections of samples are examined for a better understanding of the solder bump, CSP redistribution, VIP, and solder joint. Non-linear finite element analyses are used to determine the stress and strain in the copper VIP and the solder joint. Time-dependent non-linear analysis is used to predict the thermal-fatigue life of the VIP solder joint.