E.I. Principe, Z.E. Russell, S. DiDona, M. Therezien, B. Kempshall, K.E. Scammon, J. J. Hagen
{"title":"Large Area Automated Deprocessing of Integrated Circuits: Present and Future","authors":"E.I. Principe, Z.E. Russell, S. DiDona, M. Therezien, B. Kempshall, K.E. Scammon, J. J. Hagen","doi":"10.31399/asm.edfa.2019-3.p008","DOIUrl":null,"url":null,"abstract":"\n This article discusses the current state of large area integrated circuit deprocessing, the latest achievements in the development of automated deprocessing equipment, and the potential impact of advancements in gas-assisted etching, ion source alternatives, compact spectroscopy, and high-speed lasers.","PeriodicalId":431761,"journal":{"name":"EDFA Technical Articles","volume":"4 1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"EDFA Technical Articles","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.31399/asm.edfa.2019-3.p008","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This article discusses the current state of large area integrated circuit deprocessing, the latest achievements in the development of automated deprocessing equipment, and the potential impact of advancements in gas-assisted etching, ion source alternatives, compact spectroscopy, and high-speed lasers.