Built-in self-test for large embedded CMOS folded PLAs

Abstract

A built-in self-test (BIST) design method for large embedded CMOS folded programmable logic arrays (PLAs) is presented that is based on a deterministic, function-independent structural method. It requires about half the testing time and comparable area overhead of deterministic BIST methods applied to corresponding nonfolded PLAs. Tests to detect stuck-at, bridging, cross-point and stuck-open faults are given.<>