Design and analysis of a low-voltage electrostatic actuated RF CMOS-MEMS switch

M. Ya, A. Nordin, N. Soin
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引用次数: 13

Abstract

This paper presents the design and analysis of a radio frequency (RF) micro-electromechanical system (MEMS) switch with low actuation voltage using MIMOS 0.35μm complementary metal oxide semiconductor (CMOS) process. The advantage of this RF MEMS switch is very low actuation voltage design which is compatible with other CMOS circuit without employing a separate on-chip voltage source or charge pump unit. Moreover, using CMOS technology to design can highly simplify the fabrication process, reduce the cost and improve the device performance. The RF MEMS switch is a capacitive shunt-connection type device which uses four folded beams to support a big membrane above the signal transmission line. The pull-in voltage, von Mises stress distribution and vertical displacement of the membrane, up-state and down-state capacitances, as well as the switch impedance is calculated and analyzed by finite element modelling (FEM) simulation.
低压静电驱动射频CMOS-MEMS开关的设计与分析
介绍了一种基于0.35μm互补金属氧化物半导体(CMOS)工艺的低驱动电压射频(RF)微机电系统(MEMS)开关的设计与分析。这种射频MEMS开关的优点是非常低的驱动电压设计,与其他CMOS电路兼容,而无需使用单独的片上电压源或电荷泵单元。此外,利用CMOS技术进行设计,可以大大简化制造工艺,降低成本,提高器件性能。RF MEMS开关是一种电容式并联连接装置,它使用四个折叠梁来支撑信号传输线上方的大膜。通过有限元模拟计算和分析了膜的拉入电压、von Mises应力分布和垂直位移、上、下状态电容以及开关阻抗。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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