A simple mobility model for electrons and holes

I. Takata
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引用次数: 4

Abstract

This article reports a trial to find a simple quantitative relation which explains drift mobilities for electrons and holes in various semiconductors on the same point of view as the saturation velocity analysis which was presented at ISPSD'97 by the author (Takata, Proc. ISPSD'97, pp. 133-136, 1997). A newly proposed model was based on the primitive mobility equation (/spl mu//sub d/=q/spl middot//spl tau//sub m//m/sub dr/*) and the factors which determine a momentum relaxation time (/spl tau//sub m/=L/sub m//v/sub eff/) were chosen such that a mean free path (L/sub m/) was equal to the lattice constant (a) times 40 (L/sub m//spl ap/40/spl middot/a) and the effective velocity (v/sub eff/) equalled the thermal velocity (v/sub th/). Then the author tried to find the simplest rule for effective masses (m/sub dr//sup */) to explain the experimental values for electrons and holes in the major indirect-transition-type semiconductors, such as diamond, 4H-SiC, 6H-SiC, 3C-SiC, Si, GaP, AlSb, Ge and GaAs. On many materials, the conductive effective mass (m/sub c//sup */) is fitting for the electron's effective mass (m/sub dr//sup */) and the longitudinal effective mass (m/sub 1//sup */) for the hole's. This model may be useful for evaluation of approximate mobilities for newly developing materials such as SiC or diamond. The author proposes that conventional transport theory has serious problems for such materials, especially in terms of holes. Even if the theory of this paper is not solid, there is room to discuss some new fundamental mechanisms on these subjects.
电子和空穴的简单迁移率模型
本文报告了一项试验,旨在找到一个简单的定量关系,从与作者在ISPSD'97上提出的饱和速度分析相同的角度来解释各种半导体中电子和空穴的漂移迁移率(Takata, Proc. ISPSD'97, pp. 133-136, 1997)。在原始迁移率方程(/spl mu//sub d/=q/spl middot//spl tau//sub m//m/ /sub dr/*)的基础上,选择决定动量松弛时间的因素(/spl tau//sub m/=L/sub m//v/sub eff/),使平均自由程(L/sub m/)等于晶格常数(A)乘以40 (L/sub m//spl ap/40/spl middot/ A),有效速度(v/sub eff/)等于热速度(v/sub th/)。然后,作者试图找到有效质量(m/sub dr//sup */)的最简单规则来解释金刚石、4H-SiC、6H-SiC、3C-SiC、Si、GaP、AlSb、Ge和GaAs等主要间接过渡型半导体中电子和空穴的实验值。在许多材料上,导电有效质量(m/sub c//sup */)与电子的有效质量(m/sub dr//sup */)和空穴的纵向有效质量(m/sub 1//sup */)相拟合。该模型可用于评估新开发材料(如SiC或金刚石)的近似迁移率。作者提出,传统的输运理论对这类材料存在严重的问题,特别是在空穴方面。即使本文的理论不扎实,但在这些问题上仍有讨论一些新的基本机制的空间。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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