P. Veiling, M. Agethen, E. Herenda, W. Prost, W. Stolz, F. Tegude
{"title":"LP-MOVPE grown GaAs- and InP-based HBTs using all-liquid alternative sources","authors":"P. Veiling, M. Agethen, E. Herenda, W. Prost, W. Stolz, F. Tegude","doi":"10.1109/ICIPRM.1999.773734","DOIUrl":null,"url":null,"abstract":"The liquid alternative group-V precursors TBAs/TBP and CBr/sub 4//DitBuSi as group-IV dopant sources are used to grow GaAs- and InP-based HBT layer stacks. The LP-MOVPE growth of III-V semiconductors using all-liquid sources exhibit a reduced hazard potential and allow a reduced growth temperature which fits to the needs of carbon doping in HBT layer stacks. State-of-the-art InGaP/GaAs HBTs are grown at constant growth temperature (T/sub gt/=60/spl deg/C) and nearly constant V/III-ratio (10<V/III<15) enabling a simplified MOVPE process control. The process control for InGaAs/InP-HBTs is also simplified compared to the use of standard precursors. The InP-HBT structures are grown in between 500/spl deg/C<T/sub pr/<600/spl deg/C temperature and 5<V/III<30 V/III-ratio range.","PeriodicalId":213868,"journal":{"name":"Conference Proceedings. Eleventh International Conference on Indium Phosphide and Related Materials (IPRM'99) (Cat. No.99CH36362)","volume":"70 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Proceedings. Eleventh International Conference on Indium Phosphide and Related Materials (IPRM'99) (Cat. No.99CH36362)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIPRM.1999.773734","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The liquid alternative group-V precursors TBAs/TBP and CBr/sub 4//DitBuSi as group-IV dopant sources are used to grow GaAs- and InP-based HBT layer stacks. The LP-MOVPE growth of III-V semiconductors using all-liquid sources exhibit a reduced hazard potential and allow a reduced growth temperature which fits to the needs of carbon doping in HBT layer stacks. State-of-the-art InGaP/GaAs HBTs are grown at constant growth temperature (T/sub gt/=60/spl deg/C) and nearly constant V/III-ratio (10