J. Choo, S. Jeong, Hyung Tae Kim, Yeong Jin Yu, Hyun Shin Park, Choong-heui Jeong
{"title":"Electrostatic analysis of a short accident in cable trays for intelligent pressure transmitters","authors":"J. Choo, S. Jeong, Hyung Tae Kim, Yeong Jin Yu, Hyun Shin Park, Choong-heui Jeong","doi":"10.1109/ELECO.2015.7394641","DOIUrl":null,"url":null,"abstract":"We apply the mode-matching method to the electrostatic analysis of shorted enclosed-cable trays that are generally used in industrial facilities such as nuclear power plants. In mode-matching formulation on the potential distribution, we utilize Laplace's equation and superposition principle. After obtaining modal coefficients from Dirichlet and Neumann boundary conditions, we then derive the potential and electric field distributions and the capacitance matrices to evaluate the electromagnetic influence due to a short accident.","PeriodicalId":369687,"journal":{"name":"2015 9th International Conference on Electrical and Electronics Engineering (ELECO)","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 9th International Conference on Electrical and Electronics Engineering (ELECO)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ELECO.2015.7394641","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
We apply the mode-matching method to the electrostatic analysis of shorted enclosed-cable trays that are generally used in industrial facilities such as nuclear power plants. In mode-matching formulation on the potential distribution, we utilize Laplace's equation and superposition principle. After obtaining modal coefficients from Dirichlet and Neumann boundary conditions, we then derive the potential and electric field distributions and the capacitance matrices to evaluate the electromagnetic influence due to a short accident.