{"title":"Physics of Gap-state Control at Metal/Semiconductor Junctions; Schottky Barrier and Interface Defects","authors":"T. Nakayama","doi":"10.23919/IWJT.2019.8802894","DOIUrl":null,"url":null,"abstract":"In this paper, we explain recent advances in the understanding and control of Schottky barrier and interface defects at metal/semiconductor interfaces, by illustrating metal/Ge and metal/(SiC,GaN) interfaces.","PeriodicalId":441279,"journal":{"name":"2019 19th International Workshop on Junction Technology (IWJT)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 19th International Workshop on Junction Technology (IWJT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/IWJT.2019.8802894","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In this paper, we explain recent advances in the understanding and control of Schottky barrier and interface defects at metal/semiconductor interfaces, by illustrating metal/Ge and metal/(SiC,GaN) interfaces.