Accessibility analysis on data flow graph: an approach to design for testability

Abstract

Increasing the accessibility of an internal circuit node is one way to achieve design for testability. An algorithm for accessibility analysis based on a data flow graph (DFG) is presented. Based on this analysis, an approach is proposed for improving total accessibility. This is accomplished by selecting the minimum set of circuit nodes that need to be made accessible to ensure that all other nodes are accessible. A simple modification to the DFG that increases accessibility is presented.<>