An On-die Oscilloscope for System-Level ESD Noise Monitoring

Abstract

An on-die oscilloscope circuit is proposed for monitoring of system-level electrostatic discharge (ESD) noises at a power supply or signal line of an integrated circuit (IC). The noise waveform is sampled and converted to digital data in real time. ESD event detector circuits provide a trigger signal for holding the digital data when the ESD event is detected. The digital data are converted back to analog noise waveforms through post-processing. The operations of the proposed on-die oscilloscope circuit are validated in circuit simulations.