A method to determine the frequency performance and noise margin of various interconnect technologies

J. Kar, R. Shukla, B. Bhattacharyya
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Abstract

In this paper we have shown a method to evaluate various interconnect technologies by circuit simulations. Two different BGA packages with organic and ceramic substrate, mounted on conventional FR4 board are under consideration. We also have taken a configuration by using MCM interconnect where all the chips are mounted by C4 technology directly on copper polymide on ceramic substrate that has small design features, 25 micron line width and 50 micron space. We have considered the performance of the two different substrates, organic and ceramic substrates with BGA packages compared to MCM interconnect in both T and BUS design.
确定各种互连技术的频率性能和噪声裕度的方法
本文给出了一种通过电路仿真来评估各种互连技术的方法。两种不同的BGA封装与有机和陶瓷衬底,安装在传统的FR4板正在考虑。我们还采用了MCM互连的配置,其中所有芯片都通过C4技术直接安装在陶瓷基板上的铜聚酰胺上,该基板具有小设计特征,线宽25微米,空间50微米。我们考虑了两种不同的衬底,有机和陶瓷衬底与BGA封装在T和BUS设计中与MCM互连的性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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