Tunneling Dynamics and Resonant Coupling of Electrons in GaAs/AlAs Coupled Double Quantum Well Structures under Electric Fields

T. Matsusue, M. Tsuchiya, H. Sakaki
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Abstract

Resonant tunneling(RT) phenomenon in double-barrier(DB) heterostructure[1,2] has a conceptual similarity to a transmission of optical waves in Fabry-Perot (FP) resonator and involves time delay. Its dynamics should be investigated since they limit the ultimate speed of RT devices. Such a study will also clarify similarities and differences between electronic and optical waves. In our previous work[3], we investigated the tunneling escape process of electrons from AlAs/GaAs/AlAs DBRT structures. The measured escape rate was well explained by the idealized theory of FP-like model, which predicts the tunneling escape time τ in DBRT structures is given by |t| 2vk/Lw, when |t|2 ≪1, where t is the transmission coefficient through the barrier, vk is the group velocity of electrons and Lw is the well width. This predicted escape time is equal to the one calculated by the sequential tunneling model, suggesting that the tunneling escape time is not strongly dependent on the coherency of electron waves. This simple relation may not hold for the tunneling process between quantum wells(QW), where resonant coupling effect plays a more sophisticated role. To clarify the resonant tunneling phenomena between QWs, we report, in this paper, our study on electron dynamics in several different double GaAs QW structures separated by thin AlAs barrier, where the coupling condition between QWs was varied by electric fields. Tunneling process was studied at ~20K by measuring time resolved photoluminescence(PL). Picosecond pulses of a mode-locked dye laser were used to generate electron hole pairs in QWs, and the subsequent PL from particular QWs was monitored by a streak camera to determine the time variation of electron density in the QWs. Note that the electrons are lost either by recombination (radiative[4] and nonradiative) and/or by tunneling process. Since the mass of heavy hole is quite heavy, hole tunneling can be neglected at least in the initial phase of tunneling.
电场作用下GaAs/AlAs耦合双量子阱结构中电子的隧穿动力学和共振耦合
双势垒(DB)异质结构中的共振隧穿(RT)现象[1,2]在概念上与光波在Fabry-Perot (FP)谐振腔中的传输相似,并且涉及时间延迟。它的动力学应该被研究,因为它们限制了RT装置的最终速度。这样的研究也将澄清电子和光波之间的异同。在我们之前的工作[3]中,我们研究了AlAs/GaAs/AlAs DBRT结构中电子的隧穿逃逸过程。所测得的逃逸率可以用类fp模型的理想化理论很好地解释,该理论预测DBRT结构中的隧穿逃逸时间τ为|t| 2vk/Lw,当|t|2≪1时,t为穿过势垒的透射系数,vk为电子群速度,Lw为阱宽。这一预测的逃逸时间与序列隧穿模型计算的逃逸时间相等,表明隧穿逃逸时间与电子波的相干性关系不强。这种简单的关系可能不适用于量子阱(QW)之间的隧穿过程,其中共振耦合效应起着更复杂的作用。为了阐明量子阱之间的共振隧穿现象,我们在本文中报道了我们对几个不同的双GaAs量子阱结构的电子动力学的研究,其中量子阱之间的耦合条件随电场的变化而变化。通过测量时间分辨光致发光(PL),研究了~20K下的隧穿过程。利用锁模染料激光器的皮秒脉冲在量子阱中产生电子空穴对,用条纹相机监测特定量子阱的后续PL,以确定量子阱中电子密度的时间变化。注意,电子通过复合(辐射[4]和非辐射)和/或隧穿过程损失。由于重孔的质量相当大,因此至少在掘进初期可以忽略洞洞掘进。
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