{"title":"Enabling Facility Re-Use for 300mm Semiconductor Manufacturing via Integration of Automated Material Handling System and Facility Design","authors":"S. Seall, D. Steele, M. Jung","doi":"10.1109/ASMC.2006.1638764","DOIUrl":null,"url":null,"abstract":"This paper describes issues faced by Intel during planning for its first conversion of an existing high volume 200mm semiconductor factory to manufacturing on 300mm wafers. A summary of the constraints and challenges, analysis of alternatives, and description of the adopted solution for modifying AMHS and facility design to allow re-use of an existing 200mm semiconductor fab for manufacturing semiconductors on 300mm wafers is discussed","PeriodicalId":407645,"journal":{"name":"The 17th Annual SEMI/IEEE ASMC 2006 Conference","volume":"87 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"The 17th Annual SEMI/IEEE ASMC 2006 Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASMC.2006.1638764","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper describes issues faced by Intel during planning for its first conversion of an existing high volume 200mm semiconductor factory to manufacturing on 300mm wafers. A summary of the constraints and challenges, analysis of alternatives, and description of the adopted solution for modifying AMHS and facility design to allow re-use of an existing 200mm semiconductor fab for manufacturing semiconductors on 300mm wafers is discussed