Effects of low-temperature buffer layer on the quality of RF magnetron sputtering grown ZnO/Si films

Il-soo Kim, S. Jeong, Sang-Sub Kim, Byung-Teak Lee
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Abstract

Results of detailed characterization indicate that the PL emission and the microstructure of ZnO/Si films grown by RF magnetron sputtering are significantly improved by increasing growth temperature and inserting low temperature buffer layer.
低温缓冲层对射频磁控溅射生长ZnO/Si薄膜质量的影响
详细表征结果表明,通过提高生长温度和插入低温缓冲层,射频磁控溅射生长的ZnO/Si薄膜的PL发射和微观结构得到了显著改善。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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