Monte Carlo analysis of tunneling and thermionic transport in a reverse biased Schottky diode

E. Pascual, R. Rengel, M. Martín
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引用次数: 3

Abstract

A Monte Carlo investigation of transport through Schottky barriers is presented. A WKB based injection-absorption model has been developed, thus allowing correctly reproducing the experimental J-V curves. The reverse-bias regime is analyzed in depth, and the main features of charge transport (including the evidence of quasiballistic phenomena) are discussed by considering internal quantities such as average energy, velocity and concentration of carriers, electric field and potential profiles, together with velocity distribution functions. Tunneling processes show to have a great importance for low and moderately high reverse applied voltages.
反向偏置肖特基二极管中隧穿和热离子输运的蒙特卡罗分析
提出了一种通过肖特基障碍的蒙特卡罗研究方法。建立了基于WKB的注射-吸收模型,从而可以正确地再现实验J-V曲线。通过考虑载流子的平均能量、速度和浓度、电场和电位分布以及速度分布函数等内部量,深入分析了电荷输运的主要特征(包括准稳态现象的证据)。隧道过程显示出对低和中等高的反向施加电压非常重要。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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