High integrity multi-core modelling for future systems (HI-MCM)

Abstract

Modern embedded applications already integrate a multitude of functionalities with potentially different criticality levels into a single system. Driven by the availability of embedded multi-core System-on-Chips, this trend is expected to grow in the near future. Without appropriate preconditions, the integration of mixed-criticality subsystems can lead to a significant and potentially unacceptable increase of engineering and certification costs.