A practical application of the response surface methodology to power electronics failure prediction

A. Renaud, E. Woirgard
{"title":"A practical application of the response surface methodology to power electronics failure prediction","authors":"A. Renaud, E. Woirgard","doi":"10.1109/EUROSIME.2017.7926231","DOIUrl":null,"url":null,"abstract":"This study deals with a simulation and data processing method for health monitoring of a power electronics device. A typical approach to power electronics lifetime assessment is to run accelerated ageing tests and statistical methods to determine a mean time to failure for a given mission profile. Using safety coefficients, an expected service life is then known for a given unit. Depending on the consistency of the test protocol with the in-use ageing rate, lifetime predictions can be substantially different from the component actual lifespan. To manage these differences, safety coefficients and maintenance plans are implemented to assure a reliable operation and avoid failures. At due date, a device is then replaced regardless of its working ability and is considered a pure loss.","PeriodicalId":174615,"journal":{"name":"2017 18th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)","volume":"46 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 18th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUROSIME.2017.7926231","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

This study deals with a simulation and data processing method for health monitoring of a power electronics device. A typical approach to power electronics lifetime assessment is to run accelerated ageing tests and statistical methods to determine a mean time to failure for a given mission profile. Using safety coefficients, an expected service life is then known for a given unit. Depending on the consistency of the test protocol with the in-use ageing rate, lifetime predictions can be substantially different from the component actual lifespan. To manage these differences, safety coefficients and maintenance plans are implemented to assure a reliable operation and avoid failures. At due date, a device is then replaced regardless of its working ability and is considered a pure loss.
响应面法在电力电子系统故障预测中的实际应用
本文研究了电力电子设备健康监测的仿真与数据处理方法。电力电子寿命评估的一种典型方法是运行加速老化试验和统计方法,以确定给定任务剖面的平均失效时间。使用安全系数,就可以知道给定装置的预期使用寿命。根据测试协议与使用中的老化率的一致性,寿命预测可能与组件的实际寿命有很大不同。为了管理这些差异,实施了安全系数和维护计划,以确保可靠运行并避免故障。在到期时,不管设备的工作能力如何,都将其更换,并将其视为纯损失。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信