{"title":"A practical application of the response surface methodology to power electronics failure prediction","authors":"A. Renaud, E. Woirgard","doi":"10.1109/EUROSIME.2017.7926231","DOIUrl":null,"url":null,"abstract":"This study deals with a simulation and data processing method for health monitoring of a power electronics device. A typical approach to power electronics lifetime assessment is to run accelerated ageing tests and statistical methods to determine a mean time to failure for a given mission profile. Using safety coefficients, an expected service life is then known for a given unit. Depending on the consistency of the test protocol with the in-use ageing rate, lifetime predictions can be substantially different from the component actual lifespan. To manage these differences, safety coefficients and maintenance plans are implemented to assure a reliable operation and avoid failures. At due date, a device is then replaced regardless of its working ability and is considered a pure loss.","PeriodicalId":174615,"journal":{"name":"2017 18th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)","volume":"46 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 18th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUROSIME.2017.7926231","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This study deals with a simulation and data processing method for health monitoring of a power electronics device. A typical approach to power electronics lifetime assessment is to run accelerated ageing tests and statistical methods to determine a mean time to failure for a given mission profile. Using safety coefficients, an expected service life is then known for a given unit. Depending on the consistency of the test protocol with the in-use ageing rate, lifetime predictions can be substantially different from the component actual lifespan. To manage these differences, safety coefficients and maintenance plans are implemented to assure a reliable operation and avoid failures. At due date, a device is then replaced regardless of its working ability and is considered a pure loss.