{"title":"Hardware reliability of embedded systems: Are we there yet?","authors":"B. Al-Hashimi","doi":"10.1109/PATMOS.2013.6662147","DOIUrl":null,"url":null,"abstract":"The last ten years has seen major academic research efforts to improve the reliability of embedded systems in the presence of various hardware faults. The talk will review the highlights of this research and also report on some effective industrial practices in dependable hardware design. The aim is to motivate further focused research in system-level design approach and automation tools for reliable and energy-efficient design of future many-core embedded systems.","PeriodicalId":287176,"journal":{"name":"2013 23rd International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS)","volume":"34 1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-11-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 23rd International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PATMOS.2013.6662147","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The last ten years has seen major academic research efforts to improve the reliability of embedded systems in the presence of various hardware faults. The talk will review the highlights of this research and also report on some effective industrial practices in dependable hardware design. The aim is to motivate further focused research in system-level design approach and automation tools for reliable and energy-efficient design of future many-core embedded systems.