Extended use of pseudo-flash reset technique for an active pixel with logarithmic compressed response

C. Cruz, Israel L. Marinho, D. Monteiro
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引用次数: 3

Abstract

The pseudo-flash reset (P-FRST) is a technique used to reduce image lag in CMOS active-pixel sensors (APS). The compact pixel topology consisting of a photodetector and three FETs (3T APS) is widely employed because of its large fill factor combined with the possibility to operate in both linear and logarithmic compressed-response (LCR) modes. The use of these two modes in a single readout cycle yields good low-light sensitivity and extended dynamic range (DR). However, fabrication non idealities result in fixed-pattern noise (FPN) across the image-sensor chip and cannot be reduced by classical double-sampling readout subtraction (DSRS). In the present work, we propose an extended use of the P-FRST technique to provide an adequate voltage reference on pixel, in order to enable DSRS, thus reducing FPN in conventional 3T APS operating in mixed linear-LCR mode.
对具有对数压缩响应的活动像素扩展使用伪闪光复位技术
伪闪光复位(P-FRST)是一种用于减少CMOS有源像素传感器(APS)图像滞后的技术。紧凑的像素拓扑结构由一个光电探测器和三个场效应管(3T APS)组成,由于其大的填充因子以及在线性和对数压缩响应(LCR)模式下工作的可能性而被广泛应用。在单个读出周期中使用这两种模式可产生良好的低光灵敏度和扩展的动态范围(DR)。然而,制造非理想性导致图像传感器芯片上的固定模式噪声(FPN)无法通过经典的双采样读出减法(DSRS)来降低。在目前的工作中,我们建议扩展使用P-FRST技术来提供足够的像素电压参考,以实现DSRS,从而降低在混合线性- lcr模式下工作的传统3T APS的FPN。
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