{"title":"Analysis of the current runaway phenomenon in the overcurrent limited mode of the DC-DC converter with current-injected control","authors":"H. Matsuo, F. Kurokawa, K. Tanaka","doi":"10.1109/INTLEC.1991.172381","DOIUrl":null,"url":null,"abstract":"In the overcurrent-limited mode of the DC-DC converter with current-injected control, it is often observed that the excessive current flows through the main power switch when the load resistance is extremely small. The authors investigate the minimum on-time interval of the switch and analyze the current runaway phenomenon in the overcurrent-limited mode of a DC-DC converter with current-injected control. As a result, the mechanism of the current runaway phenomenon is clarified and the design condition for preventing this phenomenon is presented.<<ETX>>","PeriodicalId":238105,"journal":{"name":"[Proceedings] Thirteenth International Telecommunications Energy Conference - INTELEC 91","volume":"64 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-11-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"[Proceedings] Thirteenth International Telecommunications Energy Conference - INTELEC 91","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INTLEC.1991.172381","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
In the overcurrent-limited mode of the DC-DC converter with current-injected control, it is often observed that the excessive current flows through the main power switch when the load resistance is extremely small. The authors investigate the minimum on-time interval of the switch and analyze the current runaway phenomenon in the overcurrent-limited mode of a DC-DC converter with current-injected control. As a result, the mechanism of the current runaway phenomenon is clarified and the design condition for preventing this phenomenon is presented.<>