A novel low-profile low-parasitic RF package using high-density build-up technology

Chien-Cheng Wei, M. Lin, Chin-Ta Fan, Ta-Hsiang Chiang, Ming-Kuen Chiu, S. Ru, Nan Ni, A. Cardona
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Abstract

This paper presents a low-profile low-parasitic RF package by using the high-density build-up (HD-BU) technology. This package achieves much thinner, fine pitch, and exposed design pattern feature for outstanding electrical and thermal performance. The packaging fabrication is simple and only needs several processes. This HD-BU package provides lower parasitic than other lead-frame types due to the use of very thin bonding pads. Additionally, a capacitor chip is assembled using the proposed technology for packaging demonstration and electrical performance evaluation. Based on the experimental results, the measured capacitances at 1-GHz are quite similar before and after packaging. It indicates that the HD-BU package has low parasitic capacitance even at high-frequency operation, and does not affect the electrical performance for the packaged chip. Therefore, these packages are good candidates for applications requiring low profile, low parasitic and low cost.
采用高密度堆积技术的新型低轮廓低寄生射频封装
本文提出了一种采用高密度堆积(HD-BU)技术的低外形低寄生射频封装。该封装实现了更薄、更细间距和暴露的设计模式特征,具有出色的电气和热性能。包装制作简单,只需几个工序。这种HD-BU封装提供较低的寄生比其他引线框架类型,由于使用非常薄的粘合垫。此外,利用所提出的技术组装电容器芯片,用于封装演示和电气性能评估。实验结果表明,封装前后测得的1ghz电容非常相似。说明HD-BU封装在高频工作时具有较低的寄生电容,且不影响封装芯片的电气性能。因此,这些封装是要求低姿态、低寄生和低成本的应用程序的良好候选者。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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