Study of role of channel engineering in dual-material-double-gate MOSFETs

Varun Goel, Sanjay Sharma
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引用次数: 0

Abstract

This paper presents a 2-D analytical model of threshold voltage for nanoscale graded-channel-dual-material-double-gate (GCDMDG) MOSFETs to discuss the advantage of incorporation of channel engineering in dual-material-double-gate (DMDG) MOSFETs. The 2-D analytical modeling is based upon the solution of 2-D Poisson's equation in channel region(s) using parabolic channel profile with the help of different boundary conditions and excluding the effect of interface charges. The surface potential and threshold voltage dependency on various device parameters have been studied to support the advantages of GCDMDG MOSFETs over DMDG MOSFETs. To validate the analytical model results, numerical simulation data obtained from 2-D device simulators ATLAS™ SILVACO has been used.
沟道工程在双材料双栅mosfet中的作用研究
本文提出了纳米级梯度通道双材料双栅mosfet (GCDMDG)阈值电压的二维解析模型,讨论了在双材料双栅mosfet (DMDG)中引入通道工程的优势。利用抛物型沟道剖面,在不同边界条件下,排除界面电荷的影响,求解沟道区域内的二维泊松方程,建立了二维解析模型。研究了表面电位和阈值电压对各种器件参数的依赖关系,以支持GCDMDG mosfet优于DMDG mosfet。为了验证分析模型结果,使用了从2-D设备模拟器ATLAS™SILVACO获得的数值模拟数据。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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