{"title":"Towards Low Cost High Density Bumping","authors":"A. Aintila, E. Jarvinen, S. Lalu","doi":"10.1109/IEMT.1993.639289","DOIUrl":null,"url":null,"abstract":"A chemical batch bumping method is suggested both for Flip-Chip and TAB (tape automated bonding) appli- cations Several suggestions from earlier studies by other authors are referred and commented. Experiments with a selective Ni/Au bump structure have been carried out in a prototype processing line. The initial results confirm that this method has low capital, material and labor cost As no die specific tooling is required the process will have fast tum-around time and potential even for low vol- ume low cost wafer bumping, as well as for mass production.","PeriodicalId":170695,"journal":{"name":"Proceedings of Japan International Electronic Manufacturing Technology Symposium","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Japan International Electronic Manufacturing Technology Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.1993.639289","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
A chemical batch bumping method is suggested both for Flip-Chip and TAB (tape automated bonding) appli- cations Several suggestions from earlier studies by other authors are referred and commented. Experiments with a selective Ni/Au bump structure have been carried out in a prototype processing line. The initial results confirm that this method has low capital, material and labor cost As no die specific tooling is required the process will have fast tum-around time and potential even for low vol- ume low cost wafer bumping, as well as for mass production.