Towards Low Cost High Density Bumping

A. Aintila, E. Jarvinen, S. Lalu
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引用次数: 8

Abstract

A chemical batch bumping method is suggested both for Flip-Chip and TAB (tape automated bonding) appli- cations Several suggestions from earlier studies by other authors are referred and commented. Experiments with a selective Ni/Au bump structure have been carried out in a prototype processing line. The initial results confirm that this method has low capital, material and labor cost As no die specific tooling is required the process will have fast tum-around time and potential even for low vol- ume low cost wafer bumping, as well as for mass production.
迈向低成本高密度碰撞
提出了一种用于倒装芯片(flip chip)和自动粘接(TAB)应用的化学批量碰撞方法,并参考和评论了其他作者早期研究的一些建议。在原型加工线上进行了选择性镍/金凹凸结构的实验。初步结果证实,这种方法具有较低的资本,材料和人工成本,因为不需要模具专用工具,该工艺将有快速的周转时间和潜力,即使是小批量低成本的晶圆冲击,以及大规模生产。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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