Impact of Mode Propagation on Radiated Immunity Characterization in Commonly Used TEM Cells

M. Koohestani, M. Ramdani, R. Perdriau
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引用次数: 2

Abstract

This paper investigates the impact of propagation modes on radiated immunity characterization inside most commonly used transverse electromagnetic (TEM) cells. The first six modes together with their corresponding cutoff frequencies in two standard open and closed cells are firstly introduced and presented. It is then followed by an immunity testing case study of the electromagnetic field behavior inside the cells at frequencies below and above the dominant mode. Results imply that, although not recommended in the IEC 61967-2 and 62132-2 immunity testing standards, it is actually feasible to use a TEM cell at frequencies above the dominant mode frequency if the equivalent ‖E‖-field level with respect to the input power is properly rescaled in close proximity to the IC pins whatever the location of the IC package. Moreover, due to the dependency of the location of norm maxima ‖E‖ and ‖H‖ to frequency, attention must be paid to the DUT location in the TEM cell for proper immunity assessment. This calls for the use of an open TEM cell for immunity testing as relocating the DUT position is impossible in the closed cell.
模式传播对常用TEM细胞辐射抗扰特性的影响
本文研究了在最常用的横向电磁(TEM)细胞内传播方式对辐射抗扰特性的影响。首先介绍了两种标准开式和闭式单元的前六种模态及其相应的截止频率。然后,在低于和高于主导模式的频率下,对细胞内的电磁场行为进行抗扰度测试案例研究。结果表明,尽管在IEC 61967-2和62132-2抗扰度测试标准中没有推荐,但如果相对于输入功率的等效‖E‖场电平在靠近IC引脚的地方适当地重新缩放,则在高于主模频率的频率下使用TEM单元实际上是可行的,无论IC封装的位置如何。此外,由于范数最大值‖E‖和‖H‖的位置依赖于频率,因此必须注意被测件在TEM单元中的位置,以便进行适当的免疫评估。这要求使用开放的TEM单元进行抗扰度测试,因为在封闭的单元中不可能重新定位DUT位置。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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