{"title":"Economics modelling for the determination of optimal known good die strategies","authors":"E. Dislis, I. Jalowiecki","doi":"10.1109/MCMC.1995.511997","DOIUrl":null,"url":null,"abstract":"This paper describes an economics model based approach to determining optimal KGD strategies for multi-chip modules. The economics models are described, and a case study provided using reusable die carriers to facilitate die test and burn in. This is compared to a non-KGD approach in financial terms, using the models described.","PeriodicalId":223500,"journal":{"name":"Proceedings of 1995 IEEE Multi-Chip Module Conference (MCMC-95)","volume":"109 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-01-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1995 IEEE Multi-Chip Module Conference (MCMC-95)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MCMC.1995.511997","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
This paper describes an economics model based approach to determining optimal KGD strategies for multi-chip modules. The economics models are described, and a case study provided using reusable die carriers to facilitate die test and burn in. This is compared to a non-KGD approach in financial terms, using the models described.