Design and evaluation of press-pack SiC MOSFET

Nan Zhu, Min Chen, Dehong Xu, H. Mantooth, M. Glover
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引用次数: 6

Abstract

This paper investigates the advantages of combining press-pack packaging and SiC MOSFETs to extend the application of SiC devices into the high power range. The feasibility of press-pack packaging on SiC MOSFET is illustrated by using extremely small and flexible contact pins called "fuzz buttons" in a low-profile interposer. The layout of the press-pack is designed to have very low main power loop parasitic inductance, gate loop inductance, common source inductance and provide a good balance between paralleled devices. Since the press-pack does not provide internal insulation between the active device and the heatsink, the heatsink is included in the power loop. To minimize the parasitic loop inductance, a water-cooled micro-channel heatsink less than 3 mm thick is used to obtain adequate heat dissipation, electric current carrying capability, and insulation between the cooling loop and the electrical loop. The structure and manufacturing process flow of the press-pack SiC MOSFET are provided. The thermal and electrical performances of the proposed press-pack structure are experimentally tested as well.
压封装SiC MOSFET的设计与评估
本文探讨了压包封装与SiC mosfet相结合的优势,将SiC器件的应用范围扩展到高功率范围。在SiC MOSFET上的压片封装的可行性通过在一个低调的中间层中使用极小且灵活的称为“模糊按钮”的接触引脚来说明。压包的布局被设计成具有非常低的主功率回路寄生电感、门回路电感和共源电感,并在并联器件之间提供良好的平衡。由于压包在主动式器件和散热器之间不提供内部绝缘,因此散热器包含在电源回路中。为了减小寄生回路的电感,建议选用厚度小于3mm的水冷式微通道散热器,以保证散热、载流能力,并保证散热回路和电回路之间的绝缘。给出了压封装SiC MOSFET的结构和制造工艺流程。并对所提出的压包结构的热学和电学性能进行了实验测试。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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