Woojin Ahn, J. Shim, Jeonghyeon Cho, Minchul Shin, Kyoungchoul Koo, Joungho Kim
{"title":"Analysis of power/ground noise effect on performance degradation of analog-to-digital converter","authors":"Woojin Ahn, J. Shim, Jeonghyeon Cho, Minchul Shin, Kyoungchoul Koo, Joungho Kim","doi":"10.1109/EPTC.2009.5416463","DOIUrl":null,"url":null,"abstract":"This paper presents the analysis of the effect of power/ground noise on analog-to-digital converter (ADC). Power/ground noise is one of the noise sources to degrade ADC performance. Power distribution networks of off-chip and on-chip are modeled to analyze the mount of noise coupling and frequency response. Also, power/ground noise effect on ADC circuit is analyzed by spice simulation. It is analyzed and simulated that how noise coupled on power and ground can degrade designed flash ADC performance.","PeriodicalId":256843,"journal":{"name":"2009 11th Electronics Packaging Technology Conference","volume":"2015 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 11th Electronics Packaging Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2009.5416463","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
This paper presents the analysis of the effect of power/ground noise on analog-to-digital converter (ADC). Power/ground noise is one of the noise sources to degrade ADC performance. Power distribution networks of off-chip and on-chip are modeled to analyze the mount of noise coupling and frequency response. Also, power/ground noise effect on ADC circuit is analyzed by spice simulation. It is analyzed and simulated that how noise coupled on power and ground can degrade designed flash ADC performance.