Analysis of power/ground noise effect on performance degradation of analog-to-digital converter

Woojin Ahn, J. Shim, Jeonghyeon Cho, Minchul Shin, Kyoungchoul Koo, Joungho Kim
{"title":"Analysis of power/ground noise effect on performance degradation of analog-to-digital converter","authors":"Woojin Ahn, J. Shim, Jeonghyeon Cho, Minchul Shin, Kyoungchoul Koo, Joungho Kim","doi":"10.1109/EPTC.2009.5416463","DOIUrl":null,"url":null,"abstract":"This paper presents the analysis of the effect of power/ground noise on analog-to-digital converter (ADC). Power/ground noise is one of the noise sources to degrade ADC performance. Power distribution networks of off-chip and on-chip are modeled to analyze the mount of noise coupling and frequency response. Also, power/ground noise effect on ADC circuit is analyzed by spice simulation. It is analyzed and simulated that how noise coupled on power and ground can degrade designed flash ADC performance.","PeriodicalId":256843,"journal":{"name":"2009 11th Electronics Packaging Technology Conference","volume":"2015 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 11th Electronics Packaging Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2009.5416463","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

This paper presents the analysis of the effect of power/ground noise on analog-to-digital converter (ADC). Power/ground noise is one of the noise sources to degrade ADC performance. Power distribution networks of off-chip and on-chip are modeled to analyze the mount of noise coupling and frequency response. Also, power/ground noise effect on ADC circuit is analyzed by spice simulation. It is analyzed and simulated that how noise coupled on power and ground can degrade designed flash ADC performance.
功率/地噪声对模数转换器性能下降的影响分析
本文分析了功率/地噪声对模数转换器(ADC)的影响。电源/地噪声是影响ADC性能的噪声源之一。对片外和片内配电网进行了建模,分析了配电网的噪声耦合和频率响应。通过spice仿真分析了功率/地噪声对ADC电路的影响。分析和仿真了功率和地耦合噪声对flash ADC性能的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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